Measuring Thickness Uniformity of an Adhesive Deposited on Top of a Porous Substrate

Smooth surfaces, such as glass, reflect light well and result in well-defined high amplitude signal peaks. In contrast, rough surfaces result in rapid variations in the profile height and therefore the measured thickness of a sample.

In our application note, our team of experts shares how Lumetrics used low-coherence interferometry to measure adhesive thickness on a porous substrate. 

Highlights: 

• Review a technique for non‐contact thickness measurement applied to samples that do not have smooth reflecting surfaces
• The algorithm for data processing to extract the effective thickness data for the adhesive layer