Low-Coherence Interferometry for Mid-Infrared Precision Optics Manufacturing

Accurately measuring mid-infrared materials early in the precision optics manufacturing process allows product engineers, quality managers, plant managers, and lab managers to identify product issues as soon as possible. These early catches allow for alterations to reduce waste costs and product defects.

Our latest technical paper reviews how low-coherence optical interferometry for mid-infrared precision optics manufacturing can increase quality throughput and reduce defective products.

In this technical paper, we report on an optical, non-contact, thickness measurement system for materials that are opaque in the Near infrared (NIR) through ultraviolet (UV) wavelength range.