OPTIGAUGE 2000
Low-Coherence Interferometry Measures from 100 Microns to 16 mm
The OptiGauge 2000 instrument is based on time-domain low-coherence interferometry. This technology enables absolute thickness measurement of any material that is transparent or partially transparent to the measurement of light. The OptiGauge 2000 uses infrared light with a center wavelength of approximately 2 microns.
The OptiGauge 2000 is designed to measure specialty and rare materials, such as Geranium, Gallium Arsenide, Beryllium, nanocomposite optical ceramics, and others. Conventional glass and plastic materials can be measured as well. Our patented technology allows for fast real-time measurements and can be used for online process control as well as offline quality control purposes.
- Specifications
- Features
- Applications
- Software + Accessories
- Thickness measurement range: Up to 16 mm
- Measurement Rate: 10 Hz
- Accuracy: ± 0.1 µm
- Measurement range: 100 μm-16mm
- Accuracy ±1.0 μm
- Single and multilayer measurements
- Continuous internal calibration
- NIST traceability
- Desktop or rack mount
Your Product + Our System
See how our systems work with your specific product and application in a live demonstration.
Interferometry for Quality Assurance and Traceability
Our product line is designed to fit your production line. Explore our resources below or the full library to learn about our metrology capabilities.