Materials Cross-Section Using a Low-Coherence Interferometer
Abstract — Optical thickness metrology techniques rely on illuminating the sample of ...
Enhanced Wavefront Analysis Software Improves User Experience and Measurement Capabilities
Lumetrics, Inc. (Rochester, NY) has developed the next generation of Complete Light ...
Real-time Group Refractive Index Measurement Of Fluids Using Interferometry
Abstract — Maintaining proper chemical composition of fluids is an important control ...
Automated Dimensional Measurement of Microfluidic Flow Cells
Abstract—Lumetrics, Inc. (Rochester, NY) has made inspection of internal dimensions of ...
Introducing Discovery Service From Lumetrics
Over the past 15 years Lumetrics has worked closely with many customers to develop custom ...
Wavefront API Software Application Note
Lumetrics has offered various solutions utilizing the Shack-Hartmann wavefront sensor for ...
Overview: Lumetrics Precision Measurement Solutions
Lumetrics offers high precision non-contact thickness measurement, wavefront measurement, ...
International Converting Exhibition: Measuring Multi-layer films and coatings
Lumetrics and InDev A-C-T (www.indevsystems.com) are co-exhibiting at the ICE ...
Vision Accomplished: The Bionic Eye
An interesting article from the most recent issue of Optics and Photonics News discusses ...
Measurement of Film Stacks
The field of touchscreen technology is undergoing an explosive growth and development. It ...