Revolutionizing Wafer Inspection: Lumetrics' OptiGauge II for Accurate Bonded Silicon Wafer Measurement
Silicon chip manufacturing is a complex process that requires a suite of advanced ...
OptiGauge II versus OptiGauge EMS: Features and key differences
Watch "Lab Dave" (Technology Development Scientist at Lumetrics) as he demonstrates the ...
Determining Group Refractive Index utlizing the Lumetrics OptiGauge II and RICS Fixture
The refractive index (RI) of a material is how much light is refracted or reflected when ...
Automated Optical Inspection and Multi Layer Measurement
Utilizing optical metrology solutions such as the Lumetrics OptiGauge II to measure ...
Multi Layer Stack Measurement using a Robot and OptiGauge II
In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
Lens Stack Measurement
Did you know that we all carry lens stacks in our pockets? That’s right! Your cell phone ...
Measuring Curvature using a Lumetrics Reference Signal Generator (RSG)
The addition of a reference surface allows the Lumetrics OptiGauge to provide more than ...
Multi Layer Video
Optical Metrology Provides Unique Insights into Multi Layer Materials
Product Quality Testing: Monitoring Fluid Concentrations Using the Index of Refraction
Improving Speed and Precision of Concentration Monitoring with Non-Contact Measurement ...
Video Feature: Semiconductor Chip Metrology
Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...