During the most recent SPIE Defense and Sensing Conference in National Harbor Maryland Lumetrics' metrology scientist, Paul Thomas, Ph.D discussed the benefits of using low-coherence interferometry to measure materials that are opaque and Near IR and UV wavelength ranges.
Paul’s presentation shared how non-contact low-coherence interferometry can be used to measure Mid infrared materials such as Ge and NCOC that are visible at 2.5µm or longer.
If you’d like a copy of the presentation, or simply want to learn more about Lumetrics’ innovative measurement solutions please e-mail sales@lumetrics.com
If you're interested in learning more about how Lumetrics can help solve your nano composite optical ceramic measurement and inspection challenges, reach out to their sales or engineering team for more information.
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