Advanced materials present a challenge for metrology, as they are transparent in the Mid-infrared (MIR) but opague in visible to near-infrared (NIR) light. Mid-IR materials are increasingly used in defense applications, spectroscopy, remote sensing, industrial process monitoring, and laser systems, and are now possible to measure with OptiGauge MIR technology.
Mid-IR materials include:
- Silicon
- Chalcogenide Glasses
- Germanium
- Gallium Arsenide
- Nano Composite Optical Ceramic
- Cadmium Telluride
Driven by the rigorous requirements of a Lumetrics defense customer, the OptiGauge MIR allows for faster and less expensive non-contact MIR measurement.
Challenges of MIR Material Measurement with Traditional Methods
Traditional measurement methods for advanced materials present several challenges:
- Contact vs. non-contact: Traditional methods require physical contact with the sample, which can introduce errors and contamination. The OptiGauge MIR, on the other hand, utilizes non-contact metrology, eliminating these risks.
- Assumed bulk distribution vs. precise measurements: Traditional methods often rely on assumptions about the bulk distribution of material, which can lead to inaccuracies. The OptiGauge MIR provides precise measurements without the need for assumptions.
- Sensitivity to contamination: Optics used in traditional methods are highly sensitive to contamination, which can affect the accuracy of the measurements. The OptiGauge MIR overcomes this challenge by using non-contact measurement technology.
By offering more accurate and reliable measurements, the OptiGauge MIR represents a significant advancement in material measurement technology.
Advantages of Non-Contact Thickness Measurement
Non-contact thickness measurement offers several advantages over traditional methods that require physical contact with the sample. These advantages include:
- Elimination of contamination risk: Since the OptiGauge MIR does not physically touch the material being measured, there is no risk of introducing contaminants.
- Increased precision: Non-contact measurement methods allow for highly precise measurements, minimizing errors and providing more reliable data.
- Versatility: The OptiGauge MIR can measure materials that are opaque at UV through NIR wavelengths, expanding its applications to a wide range of materials.
- Time and cost efficiency: Non-contact measurements are faster and more cost-effective compared to metrology methods that require physical contact, reducing overall testing time and cost.
These advantages make the OptiGauge MIR a valuable tool for material scientists and researchers who require accurate and efficient thickness measurements.
Introducing OptiGauge MIR Non-Contact Metrology
The OptiGauge MIR is an innovative optical, non-contact thickness measurement system designed for materials that are opaque at ultraviolet (UV) through near-infrared (NIR) wavelengths, such as Germanium and Nano-Composite Optical Ceramics (NCOCs). Unlike traditional measurement options that require physical contact with the sample or rely on assumptions about the bulk distribution of material, the OptiGauge MIR offers a more accurate and efficient solution. By utilizing non-contact metrology, the system eliminates the risk of contamination and provides highly precise measurements.
The technology behind the OptiGauge MIR is based on low coherence interferometry (LCI), which allows for precise measurement of material thickness. With this system, researchers and scientists can measure materials that are transparent in the mid-infrared (MIR) range, opening up new possibilities for various applications in material science.
The OptiGauge MIR also has the potential to enable wedge, thickness, flatness, and other measurements for MIR transparent materials, expanding the capabilities of the previous OptiGauge II system. This advancement in technology is a significant milestone in the field of material measurement and holds promise for future developments.
Case Study: Measuring Nano-Composite Optical Ceramics (NCOCs)
In a recent study conducted by Dr. Paul Thomas Ph.D., Lumetrics Metrology Scientist, the OptiGauge MIR was used to successfully measure Nano-Composite Optical Ceramics (NCOCs). To validate the accuracy of the measurements, a Silicon (Si) control was used as a reference material, which could be measured by both the OptiGauge II and the OptiGauge MIR-LCI system.
The study demonstrated that the OptiGauge MIR is capable of accurately measuring materials that are transparent in the MIR range, such as NCOCs. This opens up new possibilities for material scientists who previously faced challenges in measuring the thickness of such materials.
By leveraging the OptiGauge MIR, researchers can now obtain precise measurements of NCOCs and other MIR transparent materials, enabling advancements in various industries including optics, electronics, and aerospace.
Future Implications of MIR-LCI in Material Measurement
The introduction of MIR-LCI technology through the OptiGauge MIR opens up new possibilities for material measurement. Some of the potential future implications include:
- Enhanced measurement capabilities: MIR-LCI enables measurements of materials that are transparent in the mid-infrared range, expanding the range of materials that can be accurately measured.
- Advancements in material research: With the ability to measure MIR transparent materials, researchers can gain a deeper understanding of their properties and behavior, leading to advancements in various fields such as optics, electronics, and aerospace.
- Quality control improvements: The precise measurements provided by MIR-LCI can enhance quality control processes in industries where accurate material thickness is critical.
As technology continues to evolve, the future of material measurement looks promising with the integration of MIR-LCI systems like the OptiGauge MIR.
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