Blog | Lumetrics

Developments in Multilayer Measurement

Written by Kristin Hart Daly | July 7, 2023

Manufacturers of multilayer materials are constantly searching for ways to improve their processes and ensure the highest quality products. One such method that has proven to be highly effective in achieving these goals is the use of non-contact low-coherence interferometry. By utilizing this technology, manufacturers can improve their inspection process.

The Lumetrics' OptiGauge II (OGII) is a time-domain low-coherence interferometer that has been successfully deployed to enhance product development (R&D), Quality Assurance / compliance, and production.  By implementing an advanced metrology solution, such as the OGII, manufacturers can replace older less accurate methodologies and gain operational efficiencies while reducing inspection related waste.  

Please watch the video demonstration to see just how efficient measurements can be

 

 

If you're interested in learning more about how Lumetrics can help solve your multi-layer measurement and inspection challenges, reach out to their sales or engineering team for more information.