Blog Post by Kristin Hart Daly
January 17, 2023
Determining Group Refractive Index utlizing the Lumetrics OptiGauge II and RICS Fixture
The refractive index (RI) of a material is how much light is refracted or reflected when ...
Start Reading
October 25, 2022
Automated Optical Inspection and Multi Layer Measurement
Utilizing optical metrology solutions such as the Lumetrics OptiGauge II to measure ...
Start Reading
August 24, 2022
Multi Layer Stack Measurement using a Robot and OptiGauge II
In our newest video, David Compertore, Lumetrics' Principal Scientist, measures a stack ...
Start Reading
July 27, 2022
Lens Stack Measurement
Did you know that we all carry lens stacks in our pockets? That’s right! Your cell phone ...
Start Reading
July 12, 2022
Measuring Curvature using a Lumetrics Reference Signal Generator (RSG)
The addition of a reference surface allows the Lumetrics OptiGauge to provide more than ...
Start Reading
June 6, 2022
Multi Layer Video
Optical Metrology Provides Unique Insights into Multi Layer Materials
Start Reading
May 11, 2022
Product Quality Testing: Monitoring Fluid Concentrations Using the Index of Refraction
Improving Speed and Precision of Concentration Monitoring with Non-Contact Measurement ...
Start Reading
March 25, 2022
Video Feature: Semiconductor Chip Metrology
Using Non-Contact Low Coherence Interferometry to Improve Wafer Inspection & Quality ...
Start Reading
February 15, 2022
Achieving Higher Quality & Efficiencies with Non-Contact Thickness Measurement
Exploring the Role of Interferometry in Medical Device Manufacturing The ability to ...
Start Reading
January 25, 2022
Semiconductor & Chip Market Outlook
Global Shortage of Silicon Wafer Chips Fuels Ongoing Growth and High Throughput Demand ...
Start Reading